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Modern Electronic Materials 10(4) (2024)
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Epitaxial layers and multilayered compositions
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Research Article
In situ reflection electron microscopy for the surface processes analysis during sublimation and epitaxial growth of layered metal chalcogenides
    Sergei A. Ponomarev,     Dmitry I. Rogilo, Konstantin E. Zakhozhev,     Dmitry A. Nasimov,     Nina N. Kurus, Anton K. Gutakovskii,     Konstantin A. Kokh,     Alexander G. Milekhin, Dmitry V. Sheglov,     Alexander V. Latyshev
Part of: Epitaxial layers and multilayered compositions
10.3897/j.moem.10.4.144317
 30-12-2024
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 251-261
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