Article title

Abstract

Keywords

1. Introduction

2. In situ reflection electron microscopy and its characteristics

3. Si(111) surface interaction with Se molecular beam

4. Growth of layered SnSe2 and In2Se3 on Si(111) surface

5. Bi2Se3(0001) sublimation during Se deposition

6. Growth of layered Bi2Se3, In2Se3 and SnSe2 on Bi2Se3(0001) surface

7. Conclusion

Acknowledgments

References