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Modern Electronic Materials 8(4) (2022)
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Research Article
Methods of dislocation structure characterization in AIIIBV semiconductor single crystals
    Stanislav N. Knyazev,     Aleksandr V. Kudrya,     Nikita Yu. Komarovskiy,     Yuri N. Parkhomenko,     Elena V. Molodtsova,     Vyacheslav V. Yushchuk
Part of: Materials science and technology. Semiconductors
10.3897/j.moem.8.4.99385
 19-12-2022
 Unique: 802 | Total: 1082  | Access Period:
 Reprint: € 6,30
 131-140
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