Modern Electronic Materials 8

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Materials science and technology. Semiconductors

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Methods of dislocation structure characterization ...

Research Article

Methods of dislocation structure characterization in A^IIIB^V semiconductor single crystals

Stanislav N. Knyazev, Aleksandr V. Kudrya, Nikita Yu. Komarovskiy, Yuri N. Parkhomenko, Elena V. Molodtsova, Vyacheslav V. Yushchuk

Part of: Materials science and technology. Semiconductors

10.3897/j.moem.8.4.99385

19-12-2022

Unique: 2370 | Total: 3350

Reprint: € 6,00

131-140

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