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Modern Electronic Materials 8(2) (2022)
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Materials science and technology. Dielectrics
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Research Article
Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures
    Nina S. Kozlova,     Evgeniy A. Levashov,     Philipp V. Kiryukhantsev-Korneev,     Alina D. Sytchenko,     Evgenia V. Zabelina
Part of: Materials science and technology. Dielectrics
10.3897/j.moem.8.2.84239
 30-06-2022
 Unique: 1530 | Total: 2307  | Access Period:
 Reprint: € 5,00
 51-57
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