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Modern Electronic Materials 7(2) (2021)
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Mathematical modeling in materials science of electronic components
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Research Article
Simulation of TiN/HfO2/Pt memristor I–V curve for different conductive filament thickness
Andrey N. Aleshin, Nikolay V. Zenchenko, Oleg A. Ruban
Part of: Mathematical modeling in materials science of electronic components
10.3897/j.moem.7.2.73289
 30-06-2021
 Unique: 592 | Total: 962  | Access Period:
 Reprint: € 2,60
 45-51
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