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Kirill D. Shcherbachev            
XRD Eigenmann GmbH
Schnaittach, Germany
3 articles by this author
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Research Article
Application of X-ray diffraction and reflectometry methods for analysis of damaged layers on polar faces of ZnO after surface chemical-mechanical treatment
    Kirill D. Shcherbachev,     Marina I. Voronova
10.3897/j.moem.8.1.84257
 12-04-2022
 Unique: 1219 | Total: 1722  | Access Period:
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 43-50
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Research Article
Regularities of microdefect formation in silicon during heat treatment for internal getter synthesis
Vladimir T. Bublik,     Marina I. Voronova,     Kirill D. Shcherbachev, Mikhail V. Mezhennyi, Vladimir Ya. Reznik
10.3897/j.moem.5.52812
 12-09-2019
 Unique: 1262 | Total: 1892  | Access Period:
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 133-139
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Research Article
Capabilities of X-ray diffuse scattering method for study of microdefects in semiconductor crystals
Vladimir T. Bublik,     Marina I. Voronova,     Kirill D. Shcherbachev
10.3897/j.moem.4.4.47197
 01-12-2018
 Unique: 1591 | Total: 2687  | Access Period:
 Reprint: € 6,30
 125-134
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