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Author

Sergei A. Ponomarev

Rzhanov Institute of Semiconductor Physics of the Siberian Branch of Russian Academy of Sciences
Novosibirsk, Russia

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Research Article

In situ reflection electron microscopy for the surface processes analysis during sublimation and epitaxial growth of layered metal chalcogenides

10.3897/j.moem.10.4.144317

30-12-2024

Unique: 199 | Total: 299

Reprint: € 6,00

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