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Deepak Bhatia

Rajasthan Technical University
Kota, India

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Research Article

Electrostatic force microscopy analysis of Bi_0.7Dy_0.3FeO₃ thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications

Deepak Bhatia, Sandipta Roy, S. Nawaz, R.S. Meena, V.R. Palkar

10.3897/j.moem.4.2.33306

01-06-2018

Unique: 1430 | Total: 2426

Reprint: € 6,30

77-85

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