Research Article |
Corresponding author: Dmitry A. Kiselev ( dm.kiselev@gmail.com ) © 2023 Mikhail S. Afanasiev, Dmitry A. Kiselev, Alexey A. Sivov, Galina V. Chucheva.
This is an open access article distributed under the terms of the Creative Commons Attribution License (CC BY 4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
Citation:
Afanasiev MS, Kiselev DA, Sivov AA, Chucheva GV (2023) Synthesis and piezoelectric properties of freestanding ferroelectric films based on barium strontium titanate. Modern Electronic Materials 9(4): 163-168. https://doi.org/10.3897/j.moem.9.4.115181
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In this work, the membrane structures based on lead-free ferroelectric barium strontium titanate with composition Ba0.8Sr0.2TO3 (BSTO) were fabricated by a magnetron sputtering method. The formation of a single-phase Ba0.8Sr0.2TO3 with thickness of 300 nm sintered on Si substrate is confirmed by XRD analysis. It is shown that films without a silicon substrate exhibit ferroelectric and piezoelectric properties. The piezoelectric and ferroelectric behaviors of BSTO thin film without a silicon substrate were confirmed through a piezoelectric force microscopy and Kelvin probe force microscopy and measurements of the effective piezoelectric coefficients (d33 and d15). Images of the residual potential of polarized areas have been obtained on the membranes, which are stable over time despite the absence of a lower electrode. Additionally, a local of ferroelectric hysteresis loop has been observed. A combination of the structural and piezoelectric measurements reveals that it possible to create freestanding ferroelectric films based on Ba0.8Sr0.2TO3 system, establishing it as a promising candidate for high-performance electromechanical applications.
ferroelectric domain structure, ferroelectric membrane, hysteresis, piezoelectric properties, structure
Electromechanical energy conversion of piezoelectric materials is the basis for a wide range of sensor and communication technologies, including those used for ultrasound imaging and cell phones [
Lu et al. [
Another key component of a dynamic, large-area, deformable, and wearable sensing device is the creation of flexible thin-film electrodes. An ideal flexible conductive material should have high electrical conductivity and strength even under extreme and complicated mechanical deformation conditions. In addition, mechanical flexibility and stability are priority characteristics for research and development.
For our study, a silicon membrane with a ferroelectric film of BSTO composition deposited on its surface was prepared as shown in Fig.
The BSTO film deposition was carried out by high-frequency (RF) sputtering of a stoichiometric target of the same composition at elevated oxygen pressures on a Plasma 50 SE installation. Sputtering of the BSTO films was performed under the following conditions: oxygen pressure during the sputtering process was 60 Pa; the distance between target and substrate was 10 mm; the substrate temperature was 630 °C. The film growth rate was ~6.0 nm/min at these conditions. The crystal structure of BSTO films was studied by X-ray diffraction analysis on an automated double-crystal diffractometer DRON-3 operating according to the Bragg–Brentano scheme. An X-ray tube with a copper anode was used as a radiation source with the wavelength of 0.1541 nm. A quartz monochromator was used to isolate the Kα1 line from the spectrum.
Schematic representation of the fabricated structure (a); optical image of the membrane (top view) (b)
To visualize the surface, piezoelectric response and surface potential signal, a scanning probe microscope Ntegra Prima (NT-MDT Spectrum Instruments, Russia) was used. The measurements were carried out by using the piezoelectric response force microscopy (the MCos signal was recorded) by applying an alternating voltage with an amplitude of 3 V and a frequency of 27 kHz to a conducting probe, as well as in the Kelvin mode using probes of the NSG10/Pt series to record the surface potential signal. The scanning area did not exceed 20 × 20 μm2.
The results of X-ray diffraction analysis of the BSTO film are shown in Fig.
The BSTO membrane surface, visualized using a scanning probe microscope, has a grain structure with an average crystallite size of 150–200 nm and roughness parameters: Rz = 5.1 nm and Ra = 4.0 nm (Fig.
Images of the surface (a) of a membrane based on BSTO; vertical piezoresponse signal (b); lateral piezoresponse signal (c)
To calculate the values of the effective piezoelectric coefficients d33 and d15, we have used the methodology proposed in the work [
An alternating voltage of varying amplitude (from 1 to 10 V) with a frequency of 27 kHz, which is much lower than the contact resonance frequency of the probe-sample system, was applied to the cantilever of a scanning probe microscope, and the deformation of the sample under the influence of alternating voltage was recorded in units of picometers. Next, the values of d33 (based on the vertical piezoresponse signal) and d15 (based on the lateral piezoresponse signal) were found from the approximation by a linear function of the resulting deformations. The results of calculations are presented in Fig.
The following numerical values of the effective piezoelectric coefficients on the membrane: d33 = 3.1 pm/V and d15 = 25.3 pm/V were obtained. In comparison, the values obtained for the BSTO film were d33 = 15 pm/V (Fig.
Results of calculations on the effective d33 values for a membrane and a film based on BSTO
In the process of polarizing the membrane with a constant voltage, it was possible to form stable regions with different orientations of polarization from and towards the surface (Fig.
Topography of the BSTO-based membrane (a); surface potential signal obtained immediately after pre-polarization (b), after 1 h (c), after 2 h (d), and profiles (e) drawn in the middle of the images presented in (b–d): 1 is immediately after polarization; 2 is 1 h later and 3 is 2 h after polarization (the dark and light squares correspond to polarization voltages of –10 V and +10 V, respectively)
In Figs
The analysis showed that the contrast of induced areas, visualized in the Kelvin mode, is well visualized for an extended time. In 2 h after polarization, the signal amplitude of the polarized areas decreased by less than 40% compared to the initial signal obtained immediately after polarization (Fig.
A local piezoelectric hysteresis loop was obtained, which confirmed the polarization switching and the ferroelectric nature of the BSTO membrane (Fig.
We have fabricated a structure consisting of a silicon membrane (20 μm thickness) with a deposited BSTO ferroelectric film of 300 nm thickness. The crystal structure and piezoelectric properties of the freestanding BSTO film have been investigated. In the piezoelectric response force microscopy mode, the domain structure of the BSTO film is visualized, the values of effective piezoelectric coefficients and local hysteresis loops are obtained. As a result of the experiment the values d33 = 3.1 pm/V and d15 = 25.3 pm/V were obtained. Polarized regions after applied a DC voltage of magnitude ±10 V to the cantilever of the scanning probe microscope are stable over time. The presence of a piezoelectric hysteresis loop also confirms the ferroelectric nature of BSTO-based membrane structures.
The study was carried out at the expense of grant No. 22-19-00493 of the Russian Science Foundation, https://rscf.ru/project/22-19-00493/.