Synchronous double-crystal transmission topographic patterns of a (111) germanium single crystal, λ ≈ 0.035 nm, (111) silicon crystal monochromator: (a) topographic pattern for a single crystal installed at the rocking curve peak angle; (b) topographic pattern for a single crystal installed at the rocking curve middle-slope angle. Dislocations, scratches and precipitates can be seen [20]

 
 
  Part of: Knyazev SN, Kudrya AV, Komarovskiy NY, Parkhomenko YuN, Molodtsova EV, Yushchuk VV (2022) Methods of dislocation structure characterization in AIIIBV semiconductor single crystals. Modern Electronic Materials 8(4): 131-140. https://doi.org/10.3897/j.moem.8.4.99385