Methods of dislocation structure characterization in AIIIBV semiconductor single crystals

Stanislav N. Knyazev; Aleksandr V. Kudrya; Nikita Yu. Komarovskiy; Yuri N. Parkhomenko; Elena V. Molodtsova; Vyacheslav V. Yushchuk

doi:10.3897/j.moem.8.4.99385

Research Article

Modern Electronic Materials 8(4): 131-140
https://doi.org/10.3897/j.moem.8.4.99385 (19 Dec 2022)

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