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TTF as a function of power voltage VDD (the other line being grounded) at constant D, T and k |
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| Part of: Orlov AA, Rezvanov AA (2022) Simulation of time to failure of porous dielectric in advanced topology integrated circuit metallization system. Modern Electronic Materials 8(3): 107-111. https://doi.org/10.3897/j.moem.8.3.98145 |