Typical experimental X-ray patterns (dots) and Rietweld approximations (solid line) for (FeCoZr)x (PZT)100-x films (35 ≤ x ≤ 81 at.% synthesized in an Ar + O2 atmosphere on aluminum foil substrates: (1) (FeCoZr)35(PZT)65, РO = 2.4 · 10–3 Pa; (2) (FeCoZr)50(PZT)50, РO = 2.4 · 10–3 Pa; (3) (FeCoZr)63(PZT)37, РO = 2.4 · 10–3 Pa; (4) (FeCoZr)67(PZT)33, РO = 2.4 · 10–3 Pa; (5) (FeCoZr)77(PZT)23, РO = 2.4 · 10–3 Pa; (6) (FeCoZr)81(PZT)19, РO = 2.4 · 10–3 Pa; (7) (FeCoZr)50(PZT)50, РO = 3.7 · 10–3 Pa; (8) (FeCoZr)67(PZT)33, РO = 3.7 · 10–3 Pa; (9) (FeCoZr)77(PZT)23, РO = 3.7 · 10–3 Pa; (10) (FeCoZr)81(PZT)19, РO = 3.7 · 10-3 Pa; (11) aluminum foil.

 
 
  Part of: Fedotova JA (2021) Effect of synthesis conditions and composition on structural and phase states and electrical properties of nanogranular (FeCoZr)x (PZT)100-x films (30 ≤ x ≤ 85 at.%). Modern Electronic Materials 7(3): 91-97. https://doi.org/10.3897/j.moem.7.3.76277