Multifunctional system for studying physical and technical parameters of semiconductors, dielectrics and electrically insulating materials.
Part of: Timokhin VM, Garmash VM, Tedzhetov VA (2020) Technology of thermally stimulated diagnostics of anisotropy and optical axes in crystals. Modern Electronic Materials 6(4): 125-132. https://doi.org/10.3897/j.moem.6.4.65351