Defect parameter determination from TSD spectra with the Garlick–Gibson method: (a) TSD temperature dependence in linear heating mode, (b) TSD curve in Arrhenius coordinates with initial rise section.
Part of: Timokhin VM, Garmash VM, Tedzhetov VA (2020) Technology of thermally stimulated diagnostics of anisotropy and optical axes in crystals. Modern Electronic Materials 6(4): 125-132. https://doi.org/10.3897/j.moem.6.4.65351