Photonic and Terahertz applications as the next gallium arsenide market driver

Nikolay A. Kulchitsky; Arkady V. Naumov; Vadim V. Startsev

doi:10.3897/j.moem.6.3.63224

Research Article

Modern Electronic Materials 6(3): 77-84
https://doi.org/10.3897/j.moem.6.3.63224 (30 Sep 2020)

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Xia Tang, Gagan Kumar Chappa, Lucas Vieira, Martin Holena, Natasha Dropka (2023)
Decision Tree-Supported Analysis of Gallium Arsenide Growth Using the LEC Method. Crystals 13: 1659.

DOI: 10.3390/cryst13121659

Oleg Olikh, Petro Lytvyn (2022)
Defect engineering using microwave processing in SiC and GaAs. Semiconductor Science and Technology 37: 075006.

DOI: 10.1088/1361-6641/ac6f17

H. Ceric, R.L. de Orio, S. Selberherr (2023)
Microstructural impact on electromigration reliability of gold interconnects. Solid-State Electronics 200: 108528.

DOI: 10.1016/j.sse.2022.108528

H. Ceric, R.L. de Orio, S. Selberherr (2023)
Statistical study of electromigration in gold interconnects. Microelectronics Reliability 147: 115061.

DOI: 10.1016/j.microrel.2023.115061

Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr (2022)
Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics. ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) : 301.

DOI: 10.1109/ESSDERC55479.2022.9947168

H. Ceric, R. L. de Orio, S. Selberherr (2022)
Electromigration Degradation of Gold Interconnects: A Statistical Study. 2022 IEEE International Interconnect Technology Conference (IITC) : 102.

DOI: 10.1109/IITC52079.2022.9881313

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