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Research Article
Modern Electronic Materials 5(3): 107-114
https://doi.org/10.3897/j.moem.5.3.51936 (12 Sep 2019)
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  • Article title
  • Abstract
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  • 1. Introduction
  • 2. Theoretical basis of holographic measurement method
    • 2.1 Limit longitudinal spatial resolution of method (interferometer motion sensitivity)
    • 2.2 Time resolution of method
    • 2.3 Transverse spatial resolution
  • 3. Experimental
    • 3.1 Measurement system assembly and setup
    • 3.2. Specimen hologram recording
    • 3.3. Recording and quantification (analysis) of double-exposure digital holographic interference patterns
    • 3.4. Superposition of interference patterns with respective specimen surface areas (Fig. )
  • 4. Results and discussion
  • 5. Conclusion
  • References
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