(a) SPM image and (b) surface profile along the marked line of sample with several grooves formed using (upward) 1, 20, 30 and 100 needle passes.

  Part of: Stepushkin MV, Kostishin VG, Sizov VE, Temiryazev AG (2018) Use of atomic force microscope for the synthesis of GaAs/AlGaAs heterostructure base one-dimensional structure. Modern Electronic Materials 4(4): 163-166. https://doi.org/10.3897/j.moem.4.4.47093