Temperature variation of dielectric constant εr and dielectric loss tan δ for (a) and (b) SmCTO25 and (c) and (d) SmCTO50.

 
 
  Part of: Abraham K, Thomas AK, Thomas J, Saban KV (2019) Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites. Modern Electronic Materials 5(4): 145-150. https://doi.org/10.3897/j.moem.5.4.46694