Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications


	The sets of AFM images (a–c) of BDFO/ZnO thin films on 50 nm color scale and EFM images (d–f) on 5° color scale. Sample scan area is 500 nm and tip lift off height is 30 nm. The sample biases are 0 V, +5V and –5V respectively.

Part of: Bhatia D, Roy S, Nawaz S, Meena RS, Palkar VR (2018) Electrostatic force microscopy analysis of Bi_0.7Dy_0.3FeO₃ thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications. Modern Electronic Materials 4(2): 77-85. https://doi.org/10.3897/j.moem.4.2.33306