Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications


	(a) EFM maps are of the phase shift (Distance v/s Phase) graph for Bias voltage 5V (b) Distance v/s Phase graph for Bias voltage –5V.

Part of: Bhatia D, Roy S, Nawaz S, Meena RS, Palkar VR (2018) Electrostatic force microscopy analysis of Bi_0.7Dy_0.3FeO₃ thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications. Modern Electronic Materials 4(2): 77-85. https://doi.org/10.3897/j.moem.4.2.33306