The sets of EFM images for ZnO thin film (a–c) on 5° color scale. Sample Scan area is 500 nm and the tip lift-off height is 30 nm. The sample biases are 0 mV, +5V and –5V respectively.

  Part of: Bhatia D, Roy S, Nawaz S, Meena RS, Palkar VR (2018) Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications. Modern Electronic Materials 4(2): 77-85.