X-ray diffraction pattern obtained for ZnO and BDFO/ZnO thin films grown on Si substrate.

  Part of: Bhatia D, Roy S, Nawaz S, Meena RS, Palkar VR (2018) Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications. Modern Electronic Materials 4(2): 77-85. https://doi.org/10.3897/j.moem.4.2.33306