Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications


	X-ray diffraction pattern obtained for ZnO and BDFO/ZnO thin films grown on Si substrate.

Part of: Bhatia D, Roy S, Nawaz S, Meena RS, Palkar VR (2018) Electrostatic force microscopy analysis of Bi_0.7Dy_0.3FeO₃ thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications. Modern Electronic Materials 4(2): 77-85. https://doi.org/10.3897/j.moem.4.2.33306