Other versions:

(Verbatim name)

ID

(Catalog Number)

ORG

DES

Invalid DOI was provided, please try again

XML
PDF
 
 
Bluesky
Twitter
Facebook
Telegram
Mendeley
Reddit
Notify a colleague
  • ContentsContents
  • Article InfoArticle Info
  • CiteCite
  • MetricsMetrics
  • CommentComment
  • RelatedRelated
  • FigsFigs
  • TabsTabs
  • RefsRefs
  • CitedCited
  • Article title
  • Abstract
  • Keywords
  • 1. Introduction
  • 2. LTLM measurement of specific contact resistance
  • 3. Test structures and experimental technique
  • 4. Results and discussion
    • 4.1. p+–n clamping diodes
    • 4.2. Multi-pad p–i–n photodiodes
  • Conclusions
  • References
Subscribe to email alerts for current Article's categories
Powered by