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Fracture toughness measured in the {100} plane for different angles of indenter diagonal relative to the <100> direction in specimen plane for YSZ, GdSZ and SmSZ crystals |
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| Part of: Chislov AS, Borik MA, Kulebyakin AV, Lomonova EE, Milovich FO, Myzina VA, Reu AA, Ryabochkina PA, Sidorova NV, Tabachkova NYu (2024) Comparison of the structure and physicochemical properties of ZrO2 based crystals partially stabilized with Y2O3, Gd2O3 and Sm2O3. Modern Electronic Materials 10(1): 3-10. https://doi.org/10.3897/j.moem.10.1.122043 |