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Research Article
Modern Electronic Materials 9(2): 57-68
https://doi.org/10.3897/j.moem.9.2.109980 (05 Jul 2023)
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  • ContentsContents
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  • Article title
  • Abstract
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  • 1. Introduction
  • 2. Experimental
  • 3. Results and discussion
    • 3.1. I–V curves of n-Si/In2O3 : Er structure
    • 3.2. I–V curves of p-Si/In2O3 : Er structure
    • 3.3. Determination of electron injection barrier height between n type conductivity silicon substrate and In2O3 : Er film
    • 3.4. Barrier height determination for hole injection to In2O3 : Er film from p type conductivity silicon substrate
    • 3.5. Analysis of Si/In2O3 : Er heterojunction band structure
    • 3.6. Defect state density in In2O3 : Er band gap
  • 4. Conclusion
  • Acknowledgements
  • References
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